dc.contributor.author | Messier, J. | |
dc.contributor.author | Merlo Flores, J. | |
dc.date.accessioned | 2022-10-20T14:47:55Z | |
dc.date.available | 2022-10-20T14:47:55Z | |
dc.date.issued | 1963 | |
dc.identifier.uri | https://www.cnea.gob.ar/nuclea/handle/10665/2045 | |
dc.description.abstract | The temperature dependence of the Hall mobilities has been determined a s 6 -4 x l0 9 T-2'91 and 2-4 x 108 T -2 06 for holes and electrons respectively. Using for the drift mobilities the expression found by Ludwig and Watters , 2-3 x 10° T~2'7 and 2-1 x 109 T~2'5 for holes and electrons, we have calculated the temperature dependence of μh/ μd = r, and found it coherent with the observed variation of the Hall coefficient. At 300°K, for holes μH = 398 cm2 (Vγ)-1 and γp = 0.84 and for electrons μH = 1880cm2 Vδ -1 and μH = 1:31. | |
dc.format.extent | 1539-1542 p. | |
dc.format.medium | application/pdf | |
dc.publisher | American Chemical Society | |
dc.relation.ispartof | J. Phys. chem. solids V. 24 1963 | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.title | Temperature dependence of hall mobility and μh/ μd for Si. | |
dc.type | ARTÍCULO CIENTÍFICO | |
cnea.tipodedocumento | ARTÍCULO | |
dc.language.ISO639-3 | eng | |
dc.type.version | info:eu-repo/semantics/publishedVersion | |
dc.description.filiacionCNEA | Fil: Messier, J. Comisión Nacional de Energía Atómica; Argentina | |
dc.description.filiacionCNEA | Merlo Flores, J. Comisión Nacional de Energía Atómica; Argentina | |
dc.description.filiacionCNEA | Comisión Nacional de Energía Atómica; Argentina | |
dc.subject.keyword | HALL EFFECT | |
dc.subject.keyword | CARRIER DENSITY | |
dc.subject.keyword | SILICON | |
dc.subject.keyword | ELECTRONS MOBILITY | |
dc.subject.keyword | HOLE MOBILITY | |
cnea.localizacion | 01.63.04 | |