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Resistive switching : from fundamentals of nanionic redox processes to memristive device applications / edited by Daniele Ielmini and Rainer Waser.

Tipo de material: materialTypeLabelLibroEditor: Weinheim, Germany : Wiley-VCH, c2016Descripción: xviii, 755 p. : il. (principalmente col.), diagrs. ; 24 cm.ISBN: 9783527334179.Tema(s): NANOTECNOLOGIA | NANOELECTRONICA | CIRCUITOS ELECTRONICOS | CIRCUITOS DE CONMUTACION | CONDUCTIVIDAD ELECTRICA | MEMORIAS | DISPOSITIVOS DE MEMORIAS DE CAPA DELGADA | MEMORIAS MAGNETICAS | MEMORIAS DE SEMICONDUCTORES | MATERIALES | INGENIERIA ELECTRICA | FISICA DEL ESTADO SOLIDO | Materia condensada ReRAM
Contenidos:
1. Introduction to nanoionic elements for information technology / Rainer Waser, Daniele Ielmini, Hiro Akinaga, Hisashi Shima, H.-S. Philip, Wong, Joshua J. Yang, and Simon Yu -- 2. ReRAM Cells in the framework of two-terminal devices / E. Linn, M. Di Ventra, and Y. V. Pershin -- 3. Atomic and electronic structure of oxides / Tobias Zacherle, Peter C. Schmidt, and Mandfred Martin -- 4. Defect structure of metal oxides / Giuliano Gregori -- 5. Ion transport in metal oxides / Roger A. De Souza -- 6. Electrical transport in transition metal oxides / Franklin J. Wong and Shriram Ramanathan -- 7. Quantum point contact conduction / Jan van Ruitenbeek, Monica Morales Masis, and Enrique Miranda -- 8. Dielectric breakdown process / Jordi Suñé, Nagarajan Raghavan, and K. L. Pey -- 9. Physics and chemistry of nanoionic cells / Ilia Valov and Rainer Waser -- 10. Electroforming processes in metal oxide resistive-switching cells / Doo Seok Jeong, Byung Joon Choi, Cheol Seong Hwang -- 11. Universal switching behavior / Daniele Ielmini and Stephan Menzel -- 12. Quasitastic and pulse measuring techniques / Antonio Torrezan, Gilberto Mederiros-Ribeiro, and Stephan Tiedke -- 13. Unipolar resistive-switching mechanisms / Ludovic Goux and Sabina Spiga -- 14. Modeling the VCM- and ECM-Type Switching Kinetics / Stephan Menzel and Ji-Hyun Hur -- 15. Valence change observed by nanospectroscopy / Christian Lenser, Regina Dittmann, and John Paul Strachan -- 16. Interface-type switching / Akihito Sawa and Rene Meyer -- 17. Electrochemical metallization memories / Michael N. Kozicki, Maria Mitkova, and Ilia Valov -- 18. Atomic Switches / Kazuya Terabe, Tohru Tsuruoka, Tsuyoshi Hasegawa, Alpana Nayak, Takeo Ohno, Tomonobu Nakayama, and Masakazu Aono -- 19. Scaling limits of nanoionic devices / Victor Zhirnov and Gurtej Sandhu -- 20. Integration technology and cell design / Fred Chen, Jun Y. Seok, and Cheol S. Hwang -- 21. Reliability aspects / Dirk J. Wouters, Yang-Yin Chen, Andrea Fantini, and Nagarajan Raghavan -- 22. Select device concepts for crossbar arrays / Geoffrey W. Burr, Rohit S. Shenoy, and Hyunsang Hwang -- 23. Bottom-up approaches for resistive switching memories / Sabina Spiga, Takeshi Yanagida, and Tomoji Kawai -- 24. Switch application in FPGA / Toshitsugu Sakamoto, S. Simon Wong, and Young Yang Liauw -- 25. ReRAM-based neuromorphic computing / Giacomo Indiveri, Eike Linn, and Stefano Ambrogio.
Etiquetas de esta biblioteca: No hay etiquetas de esta biblioteca para este título.
Tipo de ítem Biblioteca de origen Signatura Estado Fecha de vencimiento Código de barras
Colección General Colección General Centro de Información Eduardo Savino

Centro Atómico Constituyentes

Revistero
620.3 R433 (Navegar estantería) Prestado 22/12/2024 51415

Incluye bibliografía al final de cada capítulo e índice analítico.

1. Introduction to nanoionic elements for information technology / Rainer Waser, Daniele Ielmini, Hiro Akinaga, Hisashi Shima, H.-S. Philip, Wong, Joshua J. Yang, and Simon Yu -- 2. ReRAM Cells in the framework of two-terminal devices / E. Linn, M. Di Ventra, and Y. V. Pershin -- 3. Atomic and electronic structure of oxides / Tobias Zacherle, Peter C. Schmidt, and Mandfred Martin -- 4. Defect structure of metal oxides / Giuliano Gregori -- 5. Ion transport in metal oxides / Roger A. De Souza -- 6. Electrical transport in transition metal oxides / Franklin J. Wong and Shriram Ramanathan -- 7. Quantum point contact conduction / Jan van Ruitenbeek, Monica Morales Masis, and Enrique Miranda -- 8. Dielectric breakdown process / Jordi Suñé, Nagarajan Raghavan, and K. L. Pey -- 9. Physics and chemistry of nanoionic cells / Ilia Valov and Rainer Waser -- 10. Electroforming processes in metal oxide resistive-switching cells / Doo Seok Jeong, Byung Joon Choi, Cheol Seong Hwang -- 11. Universal switching behavior / Daniele Ielmini and Stephan Menzel -- 12. Quasitastic and pulse measuring techniques / Antonio Torrezan, Gilberto Mederiros-Ribeiro, and Stephan Tiedke -- 13. Unipolar resistive-switching mechanisms / Ludovic Goux and Sabina Spiga -- 14. Modeling the VCM- and ECM-Type Switching Kinetics / Stephan Menzel and Ji-Hyun Hur -- 15. Valence change observed by nanospectroscopy / Christian Lenser, Regina Dittmann, and John Paul Strachan -- 16. Interface-type switching / Akihito Sawa and Rene Meyer -- 17. Electrochemical metallization memories / Michael N. Kozicki, Maria Mitkova, and Ilia Valov -- 18. Atomic Switches / Kazuya Terabe, Tohru Tsuruoka, Tsuyoshi Hasegawa, Alpana Nayak, Takeo Ohno, Tomonobu Nakayama, and Masakazu Aono -- 19. Scaling limits of nanoionic devices / Victor Zhirnov and Gurtej Sandhu -- 20. Integration technology and cell design / Fred Chen, Jun Y. Seok, and Cheol S. Hwang -- 21. Reliability aspects / Dirk J. Wouters, Yang-Yin Chen, Andrea Fantini, and Nagarajan Raghavan -- 22. Select device concepts for crossbar arrays / Geoffrey W. Burr, Rohit S. Shenoy, and Hyunsang Hwang -- 23. Bottom-up approaches for resistive switching memories / Sabina Spiga, Takeshi Yanagida, and Tomoji Kawai -- 24. Switch application in FPGA / Toshitsugu Sakamoto, S. Simon Wong, and Young Yang Liauw -- 25. ReRAM-based neuromorphic computing / Giacomo Indiveri, Eike Linn, and Stefano Ambrogio.

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